Temperature Dependence of Electron Drift Mobility for Ultrasonic Amplification in Cadmium Sulfide in Relation to Electron Trapping Effects

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1967-10-05

著者

• Chubachi Noriyoshi

  Research Institute Of Electrical Communication Tohoku University

• KIKUCHI Yoshimitsu

  Research Institute of Electrical Communication, Tohoku University

• IINUMA Kazumoto

  Research Institute of Electrical Communication Tohoku University

• Kikuchi Yoshimitsu

  Research Institute Of Electrical Communication Tohoku University

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• Temperature Dependence of Electron Drift Mobility for Ultrasonic Amplification in Cadmium Sulfide in Relation to Electron Trapping Effects
• Temperature Dependence of Ultrasonic Amplification in Cadmium Sulfide
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