Electrical and X-Ray Investigation of Tin in Gallium Arsenide

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1967-10-05

著者

• Aoki Hiroyuki

  Ibaraki Annexe Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

関連論文

• Solid Solubility of Nickel in Silicon Determined by Use of ^Ni as a Tracer
• Hexagonal Precipitates of Nickel in Silicon
• Precipitation of Nickel in Silicon
• Measurement of Distorted Layer Thickness of Silicon Single Crystal by X-Ray Anomalous Transmission Method
• Electrical and X-Ray Investigation of Tin in Gallium Arsenide

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