Solid Solubility of Nickel in Silicon Determined by Use of ^<63>Ni as a Tracer
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1963-11-15
著者
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Aoki Hiroyuki
Ibaraki Branch Electrical Communication Laboratory
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Yoshida Masayuki
Ibaraki Branch Electrical Communication Laboratory
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YAMAGUCHI Yoichiro
Ibaraki Branch, Electrical Communication Laboratory
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Yamaguchi Yoichiro
Ibaraki Branch Electrical Communication Laboratory
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Aoki Hiroyuki
Ibaraki Annexe Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Yamaguchi Y.
Ibaraki Branch, Electrical Communication Laboratory
関連論文
- Solid Solubility of Nickel in Silicon Determined by Use of ^Ni as a Tracer
- Hexagonal Precipitates of Nickel in Silicon
- Precipitation of Nickel in Silicon
- Measurement of Distorted Layer Thickness of Silicon Single Crystal by X-Ray Anomalous Transmission Method
- Electrical and X-Ray Investigation of Tin in Gallium Arsenide