Performance of an X-Ray Spectroanalyzer Using Pm^<147> Beta-Ray Source

概要

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A high efficiency X-ray spectroanalyzer is described which is equipped with Pm^<147> β-ray source and a Xe-CH_4 filled proportional counter. Unwanted scattered β-rays, which are liable to form a strong background, were prevented from entering the counter by placing a 60 mg/cm^2 beryllium foil in front of the counter window. This allowed a geometry of much higher efficiency to be realized than that of an ordinary apparatus in which scattered β-rays are deflected away by a magnet. Thus K X-rays above 10^4 counts/sec were able to be obtained by a 100 millicurie Pm^<147> source for the elements from Cr to Zn. With this new apparatus, the intensity of K X-rays and the intensity ratio background/K X-rays were observed for Cr, Fe, Ni and Mo using a Pm^<17> β-ray source on the one hand and using a Pm^<147> β-excited X-ray source on the other. The comparison leads to the conclusion that the former is superior for the analyses of these elements except for low concentration Mo in a matrix of high atomic number.
社団法人応用物理学会の論文
1966-01-15