Analysis of Adjacent Elements in X-ray Spectroscopy with Radioisotopes

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概要

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• X-ray fluorescence analysis was carried out with H^3/Zr and Pm^<147>/Al as primary x-ray sources. For spectro-analysis, pulse analysis with proportional counter and electronic pulse height analyser or x-ray filter is applied. In the He flow small specimen chamber, light elements as Na, Mg, Al and Si were detected. Al_2O_3 and SiO_2 mixtures were analysed with Al filter. Pulse analysis technique was applied to three element system, Cr_2O_3-Fe_2O_3-NiO mixtures, and effects of overlapped spectra were examined. Accuracies of the analysis are 0.3% for 10-20% Cr_2O_3, 1% for 70-100% Fe_2O_3 and 2% for 5-10% NiO in a counting time of one minute.

• 社団法人応用物理学会の論文
• 1963-06-15

著者

• Tanemura Takashi

  Rigaku Denki Co.

• Tanemura T.

  Rigaku Denki Co.

関連論文

• Analysis of Adjacent Elements in X-ray Spectroscopy with Radioisotopes
• Performance of an X-Ray Spectroanalyzer Using Pm^ Beta-Ray Source
• X-Ray Spectroanalysis of Light Elements Using H^3/Zr as Exciting Source

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