Measurement of Surface State Distributions in MOS Diodes with a Simple DLTS System
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1980-11-05
著者
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Kakimoto Koichi
Faculty Of Engineering Saitama University
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Katsube Teruaki
Faculty of Engineering, Saitama University
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Katsube Teruaki
Faculty Of Engineering Saitama University
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Hara Masashi
Faculty Of Engineering Saitama University
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- Measurement of Surface State Distributions in MOS Diodes with a Simple DLTS System
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