Measurements of Magnetic Field of Magnetic Recording Head by a Scanning Electron Microscope

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1974-03-05

著者

• ISHIBA Tsutomu

  Central Research Laboratory, Hitachi Ltd.

• Ishiba Tsutomu

  Central Research Laboratory Hitachi Ltd.

• SUZUKI Hidetaro

  Central Research Laboratory, Hitachi Ltd.

• Suzuki Hidetaro

  Central Research Laboratory Hitachi Ltd.

関連論文

• Nondestruetive Characterization of Deep Levels in Semi-Insulating GaAs Wafers Using Microwave Impedance Measurement
• Dependence of Deep Level Concentration on Nonstoiehiometry in MOCVD GaAs
• Measurements of Compositional Change in Semi-Insulating GaAs Single Crystals by Precise Lattice Parameter Measurements
• Single Crystal Growth of Layered Perovskite Metal Oxides
• Measurements of Magnetic Field of Magnetic Recording Head by a Scanning Electron Microscope

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