Damages Induced by Spark Discharges in LiF Single Crystals

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概要

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• The damages induced by spark discharges in LiF are studied with X-ray topography and optical and electron microscopies. Two types of damages are observed, one is revealed by optical microscore as a group of {100} cleavage cracks of V-shape with the aperture, 0.01-0.2μ, and the depth, 10-100μ. The other is found by X-ray topography as stripe pattern, which we call "spark trails". It consists of plate-like defects lying on {100} planes with the fault vector normal to {100}. The spark trails are induced prior to the cleavage cracks and would play some role in the initiation of the cracks.

• 社団法人応用物理学会の論文
• 1972-08-05

著者

• AKASHI Yoshito

  Department of Materials Engineering, Miyazaki University

• Akashi Yoshito

  Department Of Applied Physics Faculty Of Engineering Kyushu University

• YONEDA Yasuharu

  Department of Applied Physics, Faculty of Engineering, Kyushu University

• Yoneda Yasuharu

  Department Of Applied Physics Faculty Of Engineering Kyushu University

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