Application of Electron Probe Microanalysis to Heterogeneous Structure in Metals and Alloys

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概要

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• Factors governing the intensity of the characteristic X-ray beam radiated from an alloying element distributed heterogeneously in the matrix have theoretically been considered, and it has been shown that the intensity depends largely on the state of distribution of the element, introducing correction terms due to the effects of scattering process of incident electrons and of the self absorption of the characteristic X-ray beam of the element.The comparison of the values calculated by the proposed equation with the experimental results obtained from binary alloys of Al-Si and Al-Cu and an internally oxidized copper alloy has shown a satisfactory agreement.

• 社団法人応用物理学会の論文
• 1970-09-05

著者

• Isogai Akio

  Toyota Central Research & Development Laboratories Inc.

関連論文

• Effect of Primary-Ion Current Density on Charge Compensation in SIMS Analysis of a Quartz Glass
• Application of Electron Probe Microanalysis to Heterogeneous Structure in Metals and Alloys

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