Microstructure and magnetic properties of hexagonal barium-ferrite(BaM) thin films with various underlayers (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)

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概要

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• The BaM thin films and underlayers(Fe, Cr, Al_2O_3, Fe_2O_3, ZnFe_2O_4) were prepared on (100) oriented bare Si substrate by using a RF/DC magnetron sputtering system, and were compared with crystal orientation, magnetic properties and surface morphology. BaM/Cr/Si film revealed the highest coercivity of BaM films with all the underlayers. All the BaM films except BaM/Fe/Si film showed nearly same values of perpendicular and in-plane coercivities. Perpendicular anisotropy was observed in BaM/Fe/Si film. By adopting ZnFe_2O_4 as underlayer, the interdiffusion of Si from substrate was prohibited to some degree. Elongaed grains from the extinction of small parallet grains were grown with the increase of thickness at no underlayer film.

• 社団法人映像情報メディア学会の論文
• 2001-11-08

著者

• Nam In

  Kangwon National Univ.

• KIM Dong

  Kangwon National Univ

• HONG Yang

  Univ.of Idaho

• KlM Dong

  Kangwon National Univ.

関連論文

• The effect of TiO2 underlayer on crystal structure and magnetic properties of hexagonal barium-ferrite(BaM) thin films (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)
• Microstructure and Magnetic Properties of Hexagonal Barium-Ferrite(BaM)Thin Films with Various Underlayers
• The Effect of TiO_2 Underlayer on Crystal Structure and Magnetic Properties of Hexagonal Barium-Ferrite(BaM)Thin Films
• Microstructure and magnetic properties of hexagonal barium-ferrite(BaM) thin films with various underlayers (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)

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