Automated Measurement of the Resolution of Shadow-Mask CRT: A System Based on the Beam Profile Reconstruction (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)

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概要

• 論文の詳細を見る

• A system for automating resolutions measurement on shadow-mask CRT displays has been developed. The system is based on the reconstruction of beam profile through shadow-mask. This system consists of a high-resolution CCD area sensor as measuring head, a PC and some peripheral equipment.

• 社団法人映像情報メディア学会の論文
• 2000-10-19

著者

• Zheng Chen

  Irico Group

• Huang Yuhui

  Dept.of Electronic Engineering, Tsinghua University

• Du Bingchu

  Dept.of Electronic Engineering, Tsinghua University

• Wang Jianru

  Dept.of Electronic Engineering, Tsinghua University

• Si Jiahe

  Dept.of Electronic Engineering, Tsinghua University

• Chaiying Li

  IRICO Group

• Si Jiahe

  Dept.of Electronic Engineering Tsinghua University

• Du Bingchu

  Dept.of Electronic Engineering Tsinghua University

• Zhonghuai Chen

  Orient Electronic Co. Ltd.

• Wang Junsong

  Optical Information Science Laboratory Nankai University

• 王 峻松

  中国天津南〓大学光〓子所

• Huang Y

  Dept.of Electronic Engineering Tsinghua University

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• Automated Measurement of the Resolution of Shadow-Mask CRT: A System Based on the Beam Profile Reconstruction (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
• Automated Measurement of the Resolution of Shadow-Mask CRT : A System Based On the Beam Profile Reconstruction
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