Automated Measurement of the Resolution of Shadow-Mask CRT : A System Based On the Beam Profile Reconstruction
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概要
- 論文の詳細を見る
A system for automating resolutions measurement on shadow-mask CRT displays has been developed. The system is based on the reconstruction of beam profile through shadow-mask. This system consists of a high-resolution CCD area sensor as measuring head, a PC and some peripheral equipment.
- 社団法人電子情報通信学会の論文
- 2000-10-12
著者
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Zheng Chen
Irico Group
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Huang Yuhui
Dept.of Electronic Engineering, Tsinghua University
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Du Bingchu
Dept.of Electronic Engineering, Tsinghua University
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Wang Jianru
Dept.of Electronic Engineering, Tsinghua University
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Si Jiahe
Dept.of Electronic Engineering, Tsinghua University
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Chaiying Li
IRICO Group
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Si Jiahe
Dept.of Electronic Engineering Tsinghua University
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Du Bingchu
Dept.of Electronic Engineering Tsinghua University
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Zhonghuai Chen
Orient Electronic Co. Ltd.
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Wang Junsong
Optical Information Science Laboratory Nankai University
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王 峻松
中国天津南〓大学光〓子所
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Huang Y
Dept.of Electronic Engineering Tsinghua University
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- Research of Stereo Display Based on PC System
- Analysis and Improvement of a Design Method of CPT Flat Shadow Mask for Increasing Resolution (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
- Analysis and Improvement of a Design Method of CPT Flat Shadow Mask for Increasing Resolution
- Automated Measurement of the Resolution of Shadow-Mask CRT: A System Based on the Beam Profile Reconstruction (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
- Automated Measurement of the Resolution of Shadow-Mask CRT : A System Based On the Beam Profile Reconstruction
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