フーリエ級数によるX線フィルムの特性曲線の近似法

概要

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Some methods were devised for fitting the X-ray film characteristic curve. The usually measurement value has some errors, so we considered the approximation method was superior to interpolation method. We attempted an approximation of the X-ray film characteristic curve by using the Fourier Series method. Fundamental studies were performed with light sensitometry of which the measurement points were 21, 11 and 7. Then, it was applied to X-ray sensitometry and the inverse square law. The results are as follows. 1. 10-th Fourier homonics showed good adaptation to the X-ray film characteristic curve with 21-points, 8-th with 11-points, 7-th with 7-points. 2. The Fourier method was superior to the other methods for coefficient of correlation, standard deviation and residual sum of squares. 3. At the average gradient, there was no change in the variance of the number of measurement points. 4. Calculation time of this method was 9-sec at 21-points, 10-th Fourier homonics. 5. The Fourier method was useful for daily sensitometry.
公益社団法人日本放射線技術学会の論文
1988-12-01