Using the two-parameter Weibull distribution as a model for CRTs' lifetime
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概要
- 論文の詳細を見る
In this study, the accelerated life test of CRTs was performed for 2000 hours. The two-parameter Weibull distribution was introduced as a model for CRTs' lifetime. As a result, The two-parameter Weibull distribution provided a good fit to the observed lifetime data.
- 社団法人電子情報通信学会の論文
- 2000-10-13
著者
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Park Gong-Seok
Display Device Research Lab., LG Electronics Inc.
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Lee Jae-sun
Display Device Research Lab. Lg Electronics Inc.
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Weon Byung-Mook
Display Device Research Lab., LG Electronics Inc.
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Park Gong-seok
Display Device Research Lab. Lg Electronics Lnc.
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Weon Byung-mook
Display Device Research Lab. Lg Electronics Inc.
-
Lee Jae-Sun
Display Device Research Lab. , LG Electronics Inc.
-
Park Gong-Seok
Display Device Research Lab. , LG Electronics lnc.
-
Weon Byung-Mook
Display Device Research Lab. , LG Electronics Inc.
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- Using the Two-Parameter Weibull Distribution as a Model for DRTs' Lifetime (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
- Using the two-parameter Weibull distribution as a model for CRTs' lifetime