Electron Emission from MgO Thin Films by Slow lons

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概要

• 論文の詳細を見る

• We measured the energy distribution of ion-induced secondary electrons with a cylindrical mirror analyzer(CMA). Also the surface electronic structure is measured by the electron loss spectroscopy (EELS). There is no particular structure in the band gap of the MgO thin film and the gap is 6 eV approximately. However the highest energy of the secondary electrons is higher than the expected value by the conventional theory.

• 社団法人電子情報通信学会の論文
• 2000-10-13

著者

• Shinoda Tsutae

  Fujitsu Laborato Ries Ltcl.

• Baragiola Raul

  Laboratory For Atomic And Surface Physics Engineering Physics University Of Virginia

• Ishimoto Manabu

  Laboratory For Atomic And Surface Physics Engineering Physics University Of Virginia:fujitsu Laborat

• Betsui Kiichi

  Fujitsu Laboraries Ltd.,

• Betsui Kiichi

  Fujitsu Laborato Ries Ltcl.

関連論文

• Surface Discharge Color AC-Plasma Display Panel
• Influence of Film Characteristics on the Sputtering Rate of MgO (Special Issue on Electronic Displays)
• Electron Emission from MgO Thin Films by Slow Ions (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
• Electron Emission from MgO Thin Films by Slow lons

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