A Pattern Defect Inspection Method by Grayscale Image Comparison without Precise Image Alignment
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概要
- 論文の詳細を見る
- 社団法人電子情報通信学会の論文
- 2003-11-01
著者
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TATSUMI Shoji
Faculty of Engineering, Osaka City University
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Tatsumi Shoji
Faculty Of Engineering Osaka City University
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ONISHI Hiroyuki
Research and Development Center, Dainippon Screen Mfg. Co., Ltd.
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SASA Yasushi
Research and Development Center, Dainippon Screen Mfg. Co., Ltd.
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NAGAI Kenta
Software Research and Development Center, Dainippon Screen Mfg. Co., Ltd.
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Onishi Hiroyuki
Research And Development Center Dainippon Screen Mfg. Co. Ltd.
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Sasa Yasushi
Research And Development Center Dainippon Screen Mfg. Co. Ltd.
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Nagai Kenta
Software Research And Development Center Dainippon Screen Mfg. Co. Ltd.
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- A Pattern Defect Inspection Method by Grayscale Image Comparison without Precise Image Alignment