Evaluation of Hardening of UV-Light Cured Epoxy by Simultaneous Measurement of Refractive Index and Thickness Using the Low Coherence Interferometry
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概要
- 論文の詳細を見る
In this paper, the result of applying the simultaneous measurement of refractive index and thickness using lowcoherence interferometry to the evaluation of hardening of UV-cured epoxy is described. By measurement of the refractive index variation until the epoxy hardens with an error of nearly 0.2%, the accuracy equivalent to the existing gel fraction method was confirmed.
- 社団法人電子情報通信学会の論文
- 2002-02-01
著者
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Maruyama Hideki
Research & Development Lab. Kyushu Matsushita Electric Co. Ltd.
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HARUNA Masamitsu
School of Allied Health Sciences, Faculty of Medicine, Osaka University
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MITSUYAMA Teruki
Course of Electronic Engineering, Graduate School of Engineering, Osaka University
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KIYOMURA Yoshihiro
Research & Development Lab., Kyushu Matsushita Electric Co.,Ltd.
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Kiyomura Yoshihiro
Research & Development Lab. Kyushu Matsushita Electric Co. Ltd.
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Haruna Masamitsu
School And Allied Health Sciences Faculty Of Medicine Osaka University
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Mitsuyama Teruki
Course Of Electronic Engineering Graduate School Of Engineering Osaka University
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