Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index
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概要
- 論文の詳細を見る
- 2000-10-01
著者
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Maruyama Hideki
Research & Development Lab. Kyushu Matsushita Electric Co. Ltd.
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OHMI Masato
School of Allied Health Sciences, Faculty of Medicine, Osaka University
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HARUNA Masamitsu
School of Allied Health Sciences, Faculty of Medicine, Osaka University
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MITSUYAMA Teruki
Course of Electronic Engineering, Graduate School of Engineering, Osaka University
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Ohmi Masato
School And Allied Health Sciences Faculty Of Medicine Osaka University
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Haruna Masamitsu
School And Allied Health Sciences Faculty Of Medicine Osaka University
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Mitsuyama Teruki
Course Of Electronic Engineering Graduate School Of Engineering Osaka University
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