Two-Dimensional Target Profiling by Electromagnetic Backscattering (Special Issue on the 1992 Symposium on Electromagnetic Theory)
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概要
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This paper discusses methods and numerical simulations of one and two dimensional profilings for an arbitrary convex conducting target using the electromagnetic backscattering. The inversions for profile reconstructions are based upon the modified extended physical optics method (EPO). The modified EPO method assumes the modified physical optics current properly over the entire surface of conducting scatterers. First, the cross sectional area along a line of sight is reconstructed by performing iteratively the Fourier transform of the backscattering field in the frequency domain. Second, the two dimensional profile is reconstructed by synthesizing the above one dimensional results for several incident angles. Numerical simulation results of the target profiling are shown for spheroids and cone-spheroid.
- 社団法人電子情報通信学会の論文
- 1993-10-25
著者
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Uno Toru
Faculty Of Engineering Tokyo University Of Agriculture And Technology
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Uno Toru
Faculty Of Engineering Tohoku University
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Adachi Saburo
Faculty of Engineering, Tohoku University
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Adachi Saburo
Faculty Of Engineering Tohoku University
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Nakaki Tsutomu
Faculty of Engineering, Tohoku University
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Nakaki Tsutomu
Faculty Of Engineering Tohoku University:japanese Patent Office
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