Generalized Marching Test for Detecting Pattern Sensitive Faults in RAMs (Special Issue on VLSI Testing and Testable Design)

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概要

• 論文の詳細を見る

• Since semiconductor memory chip has been growing rapidly in its capacity, memory testing has become a crucial problem in RAMs. This paper proposes a new RAM test algorithm, called generalized marching test (GMT), which detects static and dynamic pattern sensitive faults (PSF) in RAM chips. The memory array with N cells is partitioned into B sets in which every two cells has a cell-distance of at least d. The proposed GMT performs the ordinary marching test in each set and finally detects PSF having cell-distance d. By changing the number of partitions B, the GMT includes the ordinary marching test for B=1 and the walking test for B=N. This paper demonstrates the practical GMT with B=2, capable of detecting PSF, as well as other faults, such as cell stuck-at faults, coupling faults, and decoder faults with a short testing time.

• 社団法人電子情報通信学会の論文
• 1993-07-25

著者

• Fujiwara Eiji

  Faculty Of Engineering Tokyo Institute Of Technology

• Hashimoto Masahiro

  Faculty Of Technology Tokyo University Of Agriculture And Technology

• Hashimoto Masahiro

  Faculty Of Engineering Tokyo Institute Of Technology

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