A Contraction Algorithm Using a Sign Test for Finding All Solutions of Piecewise-Linear Resistive Circuits
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概要
- 論文の詳細を見る
An efficient algorithm is proposed for finding all solutions of piecewise-linear resistive circuits. The algorithm is based on the idea of "contraction" of the solution domain using a sign test. The proposed algorithm is efficient because many large super-regions containing no solution are eliminated in early steps.
- 社団法人電子情報通信学会の論文
- 1996-10-25
著者
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Yamamura Kiyotaka
The Faculty Of Engineering Gunma University
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MISHINA Masakazu
the Faculty of Engineering, Gunma University
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Mishina Masakazu
The Faculty Of Engineering Gunma University
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