Pattern Generation for Locating Logic Design Errors

概要

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This paper presents techniques for generating the input patterns for locating logic design errors (PLE's) by Boolean function manipulation based on binary decision diagrams (BDD's). One PLE has one Boolean variable X or X^^-and constant values. A primary output of a correct circuit takes value X, while the designed circuit takes either 0 or 1. By using PLE's, the X-algorithms locate single or multiple logic design errors in a combinational circuit. Although PLE's play the most important role in the X-algorithms, the condition under which PLE's exist has not been formalized. This paper gives a formal analysis on the existence condition of PLE's. It is shown that the condition is always satisfied by incorporating another type of PLE. From the condition, an implicit representation of PLE's is derived. In addition, two kinds of approaches are presented for generating PLE's by Boolean function manipulation based on BDD's. One is an approach for generating all the existing PLE's. The other is a heuristic approach to obtain a limited number of PLE's in a short time. Both approaches generate PLE's including don't cares. Incorporating them, a compact representation of PLE is achieved. Experimental results have shown the compactness of the proposed representations and the availability of the pattern generation techniques.
社団法人電子情報通信学会の論文
1994-05-25