Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits

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概要

• 論文の詳細を見る
• 一般社団法人電子情報通信学会の論文
• 2004-05-01

著者

• Takayama Yoichiro

  University Of Hyogo

• Takayama Yoichiro

  University Of Electro-communications

関連論文

• A Predistortion Diode Linearizer Technique with Automatic Average Power Bias Control for a Class-F GaN HEMT Power Amplifier
• Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits

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