A Novel CDM-Like Discharge Effect during Human Body Model (HBM) ESD Stress(<Special Issue>the IEEE International Coference on SISPAD '02)

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概要

• 論文の詳細を見る

• Interactions between ESD protection devices and other components of a chip can lead to complex and not easily anticipated discharge bevahior. Triggering of a protection MOSFET is equivalent to the closing of a fast switch and can cause substantial transient discharge currents. The peak value of this current depends on the chip capacitance, resistance, properties of the protection clamp, etc. Careful optimization of the protection circuit is therefore necessary to avoid current overstress and circuit failure.

• 社団法人電子情報通信学会の論文
• 2003-03-01

著者

• Chen Jau-wen

  Lsi Logic Corp.

• AXELRAD Valery

  SEQUOIA Design Systems Inc.

• HUH Yoon

  LSI Logic Corp.

• BENDIX Peter

  LSI Logic Corp.

• Axelrad V

  Sequoia Design Systems Inc.

• Axelrad Valery

  Sequoia Design Systems

関連論文

• A Novel CDM-Like Discharge Effect during Human Body Model (HBM) ESD Stress(the IEEE International Coference on SISPAD '02)
• A Novel Procedure for Evaluating Design Scalability Based on Device Performance Linked to Photolithography
• A Novel Procedure for Evaluating Design Scalability Based on Device Performance Linked to Photolithography

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