Analog Circuit Test Using Transfer Function Coefficient Estimates(<Special Section>Test and Verification of VLSI)

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概要

• 論文の詳細を見る

• Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.

• 社団法人電子情報通信学会の論文
• 2004-03-01

著者

• Guo Zhen

  Department Of Electrical And Computer Engineering New Jersey Institute Of Technology University Heig

• Guo Zhen

  Department Of Electrical And Computer Engineering New Jersey Institute Of Technology

• SAVIR Jacob

  Department of Electrical and Computer Engineering, New Jersey Institute of Technology

• Savir Jacob

  Department Of Electrical And Computer Engineering New Jersey Institute Of Technology

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