Texture Segmentation Using Separable and Non-Separable Wavelet Frames (Special Section on Digital Signal Processing)

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概要

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• In this paper, a new feature which is characterized by the extrema density of 2-D wavelet frames estimated at the output of the corresponding filter bank is proposed for texture segmentation. With and without feature selection, the discrimination ability of features based on pyramidal and tree-structured decompositions are comparatively studied using the extrema density, energy, and entropy as features, respectively. These comparisons are demonstrated with separable and non-separable wavelets. With the three-, four-, and five-category textured images from Brodatz album, it is observed that most performances with feature selection improve significantly than those without feature selection. In addition, the experimental results show that the extrema density-based measure performs best among the three types of features investigated. A Min-Min method based on genetic algorithms, which is a novel approach with the spatial separation criterion (SPC) as the evaluation function is presented to evaluate the segmentation performance of each subset of selected features. In this work, the SPC is defined as the Euclidean distance within class divided by the Euclidean distance between classes in the spatial domain. It is shown that with feature selection the tree-structured wavelet decomposition based on non-separable wavelet frames has better performances than the tree-structured wavelet decomposition based on separable wavelet frames and pyramidal decomposition based on separable and non-separable wavelet frames in the experiments. Finally, we compare to the segmentation results evaluated with the templates of the textured images and verify the effectiveness of the proposed criterion. Moreover, it is proved that the discriminatory characteristics of features do spread over all subbands from the feature selection vector.

• 社団法人電子情報通信学会の論文
• 1999-08-25

著者

• PAN Jeng-Shyang

  Department of Electronic Engineering, National Kaohsiung University of Applied Sciences

• Pan Jeng-shyang

  Department Of Automatic Test And Control Harbin Institute Of Technology

• Pan Jeng-shyang

  Department Of Electronic Engineering National Kaohsiung Institute Of Technology

• WANG Jing-Wein

  Department of Equipment Design Center, PHILIPS PPCK

• Wang Jing-wein

  Department Of Equipment Design Center Philips Ppck

• WANG Jing-Wein

  Department of Electrical Engineering, National Cheng Kung University

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