Pan Jeng-shyang | Department Of Automatic Test And Control Harbin Institute Of Technology
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概要
- PAN Jeng-Shyangの詳細を見る
- 同名の論文著者
- Department Of Automatic Test And Control Harbin Institute Of Technologyの論文著者
関連著者
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Pan Jeng-shyang
Department Of Automatic Test And Control Harbin Institute Of Technology
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PAN Jeng-Shyang
Department of Electronic Engineering, National Kaohsiung University of Applied Sciences
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Lu Zhe‐ming
Harbin Inst. Of Technol. Shenzhen Graduate School Shenzhen Chn
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Lu Zhe-ming
Harbin Institute Of Technology Shenzhen Graduate School
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Pan Jeng‐shyang
The Department Of Electronic Engineering National Kaohsiung University Of Applied Sciences
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Zhao Yao
Institute Of Information Science Beijing Jiaotong University
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Lu Zhe-ming
Department Of Automatic Test And Control Harbin Institute Of Technology
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Pan Jeng-shyang
Department Of Electronic Engineering Kaohsiung University Of Applied Sciences
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ZHAO Yao
Institute of Information Science, Beijing Jiaotong University
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CHU Shu-Chuan
School of Informatics and Engineering, Flinders University of South Australia
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RODDICK John
School of Informatics and Engineering, Flinders University of South Australia
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LUO Hao
Department of Automatic Test and Control, Harbin Institute of Technology
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Luo Hao
Inst. Computing Technol. Chinese Acad. Sci. Beijing Chn
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Luo Hao
Department Of Automatic Test And Control Harbin Institute Of Technology
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CHU Shu-Chuan
the Department of Information Management, Cheng Shiu University
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Roddick John
School Of Informatics And Engineering Flinders University Of South Australia
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Chu Shu-chuan
The Department Of Information Management Cheng Shiu University
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LIN Chuang
Department of Automatic Test and Control, Harbin Institute of Technology
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WANG Jing-Wein
Department of Equipment Design Center, PHILIPS PPCK
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Lin Chuang
Department Of Automatic Test And Control Harbin Institute Of Technology
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Wang Jing-wein
Department Of Equipment Design Center Philips Ppck
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WANG Jing-Wein
Department of Electrical Engineering, National Cheng Kung University
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ZHU Zhenfeng
Institute of Information Science, Beijing Jiaotong University
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LI Leida
School of Information and Electrical Engineering, China University of Mining and Technology
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YUAN Xiaoping
School of Information and Electrical Engineering, China University of Mining and Technology
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Wang J‐w
National Kaohsiung Univ. Applied Sci. Kaohsiung Twn
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QIAO Yu-Long
Department of Automatic Test and Control, Harbin Institute of Technology
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SUN Sheng-He
Department of Automatic Test and Control, Harbin Institute of Technology
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Qiao Yu-long
Department Of Automatic Test And Control Harbin Institute Of Technology
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Li Lei-da
School Of Electromechanical Engineering Xidian University
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GUO Bao-Long
School of Electromechanical Engineering, Xidian University
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Guo Bao-long
School Of Electromechanical Engineering Xidian University
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Pan Jeng‐shyang
National Kaohsiung Univ. Applied Sci. Kaohsiung Twn
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Pan J‐s
Harbin Inst. Of Technol. Harbin Chn
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Pan Jeng-shyang
Department Of Electronic Engineering National Kaohsiung University Of Applied Sciences
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Pan Jeng-shyang
Department Of Automatic Test And Control Harbin Institute Of Technology:department Of Electronic Eng
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Pan Jeng-shyang
Department Of Electronic Engineering National Kaohsiung Institute Of Technology
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Chen C‐h
National Cheng Kung Univ. Tainan Twn
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Sun Sheng-he
Department Of Automatic Test And Control Harbin Institute Of Technology
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Huang Chia-an
Department Of Electronic Engineering National Kaohsiung University Of Applied Sciences
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WENG ShaoWei
Institute of Information Science, Beijing Jiaotong University
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Weng Shaowei
Institute Of Information Science Beijing Jiaotong University
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Lin Chuang
Harbin Inst. Technol. Harbin Chn
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Zhu Zhenfeng
Institute Of Information Science Beijing Jiaotong University
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CHEN Ching-Hsing
Department of Electrical Engineering, National Cheng Kung University
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Zhu Zhenfeng
Beijing Jiaotong Univ. Beijing Chn
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ZHAO Yufeng
Institute of Information Science, Beijing Jiaotong University
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Zhao Yufeng
Institute Of Information Science Beijing Jiaotong University
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MENG Lili
Institute of Information Science, Beijing Jiaotong University
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WANG Anhong
Taiyuan University of Science and Technology
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BAI Huihui
Institute of Information Science, Beijing Jiaotong University
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Meng Lili
Institute Of Information Science Beijing Jiaotong University
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Bai Huihui
Institute Of Information Science Beijing Jiaotong University
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Li Leida
School Of Information And Electrical Engineering China University Of Mining And Technology
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Yuan Xiaoping
School Of Information And Electrical Engineering China University Of Mining And Technology
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PAN Jeng-Shyang
Department of Electronic Engineering, Kaohsiung University of Applied Sciences
著作論文
- A Digital Image Watermarking Method Based on Labeled Bisecting Clustering Algorithm (Information Security)
- A Digital Image Watermarking Method Based on Labeled Bisecting Clustering Algorithm
- Content Adaptive Visible Watermarking during Ordered Dithering(Application Information Security)
- Visible Watermarking for Halftone Images(Information Security)
- Video Watermarking by Space-Time Interest Points
- Lossless Data Hiding Based on Companding Technique and Difference Expansion of Triplets(Image)
- A Fast K Nearest Neighbors Classification Algorithm(Image)
- A Subsampling-Based Digital Image Watermarking Scheme Resistant to Permutation Attack
- Texture Segmentation Using Separable and Non-Separable Wavelet Frames (Special Section on Digital Signal Processing)
- Genetic Feature Selection for Texture Classification Using 2-D Non-separable Wavelet Bases(Special Section on Digital Signal Processing)
- Attacking Phase Shift Keying Based Watermarking(Image)
- High Capacity Watermark Embedding Based on Invariant Regions of Visual Saliency
- MR-MIL : Manifold Ranking Based Multiple-Instance Learning for Automatic Image Annotation
- Compatible Stereo Video Coding with Adaptive Prediction Structure