Crystallographic Orientation and Magnetic Properties of Sputtered CoCrTa/CrNi and CoCrTa/CrCu Magnetic Thin Films
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概要
- 論文の詳細を見る
The effect of additional element Cu and Ni into Cr underlayer on a CoCrT/Cr sputterd thin films was investigated. Cu and Ni contents effects on the magnetic and structural properties of CoCrT/Cr was also investigated. The addition of Ni into Cr underlayer made a XRD Peak shift to higher 2θ indicating the decrease of interplanar distance. It has been shown that the intensity and d-value of Cr (110) peak revealed the different tendency for the increase of the content of Cu and Ni. The increase in coercivity may be resulted from the change of Cr underlayer microstructure, leading to the change of CoCrTa magnetic layer microstructure.
- 社団法人電子情報通信学会の論文
- 1995-11-23
著者
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Nam I.t.
Kangwon National Univ.
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Nam I.T.
Dept. of Materials Science and Engineering, Kangwon National University
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Hong Y.K.
Orienta1 Chemicals Industries
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Jeon C.H.
Dept. of Materials Science and Engineering, Kangwon National University
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Hong Y.k.
Oriental Chemical Industries
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Jeon C.h.
Dept. Of Materials Science And Engineering Kangwon National University
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Nam I.t.
Dept. Of Materials Science And Engineering Kangwon National University
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- Crystal1ographic Orientation and Magnetic Properties of Sputtered CoCrTa/CrNi and CoCrTa/CrCu Magnetic Thin Films
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- Crystallographic Orientation and Magnetic Properties of Sputtered CoCrTa/CrNi and CoCrTa/CrCu Magnetic Thin Films