Error rate characterization in a large scale CD-ROM drive production

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概要

• 論文の詳細を見る

• An error rate characterization method in a large scale CD-ROM production is presented.

• 一般社団法人電子情報通信学会の論文
• 1996-11-22

著者

• Hsu Robert

  Acer Peripherals Inc. Storage Devices Department

• Lin Steve

  Acer Peripherals Inc. Storage Devices Department

• Wang Wai

  Acer Peripherals Inc. Storage Devices Department

• Yen Mong-shin

  Acer Peripherals Inc. Storage Devices Department

• Chen Juiho

  Acer Peripherals, Inc. Storage Devices Department

• Chen Juiho

  Acer Peripherals Inc. Storage Devices Department

• Wang Wai

  Acer Communications And Multimedia Inc.

関連論文

• Mixed-Mode Optimum Power Calibration Method in a Quasi-Constant Angular Velocity CD-Recordable/ReWritable Disc Drive
• Error rate characterization in a large scale CD-ROM drive production
• Error rate characterization in a large scale CD-ROM drive production

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