X-Ray Stress Measurement for Textured Materials

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概要

• 論文の詳細を見る

• Various stresses were applied to specimens prepared from silicon carbide and cold-rolled stainless steel, JIS type SUS 304, and the changes in peak positions of a diffraction line on a sin^2ψ diagram were investigated for x-ray diffraction measurement of residual stress of textured materials. Seven peak positions of a diffraction line measured at different ψ angles for each applied stress oscillated in a sin^2ψ diagram. However, the slope M and the intercept N of a straight line fitted to the seven peak positions varied linearly with the applied stress σ_0. It is confirmed analytically and experimentally that these experimental findings show that the lattice strain for a fixed ψ angle varies linearly with applied stress as is the case with isotropic materials. Therefore, the stress constant K of textured materials can be determined experimentally as the reciprocal of the slope of the straight line in the M-σ_0 diagram.

• 一般社団法人日本機械学会の論文
• 1997-04-15

著者

• KURITA Masanori

  Department of Mechanical Engineering, Nagaoka University of Technology

• Kurita Masanori

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Yamaguchi University

• Saito Y

  Tokyo Medical And Dental Univ. Tokyo Jpn

• SAITO Yuji

  Industrial Research Institute of Niigata Prefecture

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