An Automated X-Ray Stress Measurement System Using a Microcomputer
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概要
- 論文の詳細を見る
An automated system for a rapid and precise X-ray stress measurement using a microcomputer has been developed. A block diagram of the system and a flowchart for the stress measurement method are shown. Of the various methods, the one most suitable for the material to be measured can be programmed in this system. The residual stress in a hardened steel having a broad diffraction profile (half-width of 7.2^゜) could be measured in six minutes with a small standard deviation of 13 MPa by the Gaussian curve method using the sin^2ψ method. Both the oscillation and the fixed ψ methods, using the Gaussian curve method, allow the X-ray stress measurement of coarse-grained steels; the sin^2ψdiagram obtained by these methods had a good linearity. The residual stress measurement of an annealed chromium powder gave almost zero stress values, -3.2 to 2.9 MPa depending on the method used, showing high accuracy of the system.
- 一般社団法人日本機械学会の論文
著者
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Kurita Masanori
Department Of Mechanical Engineering Technological University Of Nagaoka
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Kurita Masanori
Department Of Electrical And Electronic Engineering Faculty Of Engineering Yamaguchi University
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Ishii Masami
Sony Co.
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MIYAGAWA Matsuo
Technological University of Nagaoka
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MIYAGAWA Matsuo
Department of Mechanical Engineering, Technology University of Nagaoka
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SUMIYOSHI Michio
Hitachi Ltd.
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SATO Fumiyoshi
Sony Co.
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SUGIHARAI Shigeru
Nippon Electric Co.
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Miyagawa M
Department Of Mechanical Engineering Technology University Of Nagaoka
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