誘導結合プラズマ質量分析法におけるスペクトル・非スペクトル干渉に関する諸研究

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In the present thesis, the mechanisms of spectroscopic interference (spectral overlap caused by interfering ion species) and non-spectroscopic interference (matrix effect) in inductively coupled plasma-mass spectrometry (ICP-MS) were clarified, and analytical methods to reduce such interference described. Interfering ion species were classified into two group: refractory oxide (MO^+) and Ar polyatomic ions (ArX^+ X=: H,C,O,N). The MO^+ resulted from the ionization of undissociated neutral oxides in the ICP. A higher plasma temperature and/or the lower partial pressure of oxygen in the ICP would be required to reduce the formation of oxide ion species. The formation of ArX^+ was related to a collision-induced reaction of Ar with X^+ occurring at the interface region, and the use of shielded ICP suppressed the collision. While, in ICP-MS coupled with the electrothermal vaporization (ETV) technique, independent matrix effects were observed. One was "signal enhancement caused by hydrogen mixed with argon carrier gas"; the other was "signal enhancement caused by a halogen matrix". Both signal-enhancement effects resulted from the promotion of ionization of analytes through a charge-transfer reaction and/or electron impact. In order to reduce such matrix effects, the separation of trace elements from the matrix constituents would be required.
社団法人日本分析化学会の論文
1998-07-05