X線による残留応力測定(写真法)に用いるX線フィルムの検討
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概要
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It is a matter of common knowledge that there are two ways, namely counter method and photo method, to measure X-ray residual stresses. It is a recent tendency that reinforcement of the counter method by a photographical method has been gradually prevailing at laboratories. At the same time, the manufactures of X-ray stress measuring apparatuses are trying to adapt the photo method every way. To cope with the above-mentioned situation, "Konishiroku" and "Fuji", both Japanese typical makers of X-ray films that form the basis of the photo method, have made efforts to review X-ray films, and carried out sufficient testings on X-ray films for both industrial and medical uses. However, there are few data for X-ray area concerning the measurement of X-ray residual stresses. Therefore, our laboratory investigated in photo sensitivity, grain size, fixing time and the like, for five varieties of Types N, S, Y, RR, and R films. which are altogether the products of the "Konishiroku", and carried out testings to determine the X-ray films best suited for the measurement of X-ray residual stresses. Putting their results together, Type N is superior to any other types in sensitivity and contrast, while it is very much inferior to any other types in grain size and fixing time. Type-S is inferior to Type N in sensitivity, and about equal in contrast, while the former is very much superior to the latter in grain size and fixing time. Type Y is shorter than any other types in fixing time, while it is equal to Type S and very much superior to Type N in grain size.
- 社団法人日本材料学会の論文
- 1963-12-15
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