X線ラウエ回折図形の自動方位解析 : マイクロコンピュータによる指数付けとステレオ投影図出力システム

概要

論文の詳細を見る
A new automatic system to analyze the orientations of the crystallographic axes of arbitrarily oriented cubic crytals using the back-reflection X-ray Laue method has been developed. The system consists fo a tablet digitizer to input thecoordinates of Laue spot, an usual microcomputer to index Laue patterns and a plotter to output stereographic projection. The accuracy of the analysis was remarkably improved in comparison with the traditional method of indexing with Greninger chart and Wulff net; it is estimated to be less than 0.1-0.2゜in consequence of optimizing the rotation of standard projection and compensating the distance between specimen and film by computation. The time required is about ten minutes.
社団法人日本材料学会の論文
1985-09-15