高分解能放射光粉末回折データを用いた結晶構造解析

概要

論文の詳細を見る
The powder diffraction method is used as an indispensable technique for materials characterization. Since the advent of the Rietveld method, it is also used as a powerful mean of structure analysis of crystalline powders. The synchrotron radiation powder diffraction data are superior with respect to angular resolution to laboratory X-ray data, and they have expanded the applicability of the powder diffraction method to exploring more complex structures. A recent development of direct-space methods opened a new way for ab initio structure determination, and they are used complementarily with traditional direct methods. Introduction of the modified weight function into the least-squares procedure in Rietveld refinement improves the accuracy of structural parameters, and it provides more reliable basis for discussing details of crystal structures.
社団法人日本セラミックス協会の論文
2001-11-01