X線による応力測定法に関する研究 : 測定値の回折面依存性について : X線応力測定特集号

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Recently, the experimental procedure of X-ray stress measurement has been notably improved because of improvement of the equipment for use as well as of revision of theoretical background. However, there are a few problems that want further investigations. One of them is the question whether the stress values obtained from the measurement of a state of stress by using different lattice plane coincide or not. This problem of diffraction plane dependence has been discussed to some extent up to data, but its real feature is still in the vague. Consequently, considering from the stand point of engineering application, it is important to determine the most favourable diffraction plane for the measurement of stress through the use of characteristic X-ray. In order to clear up the problem, the author performed the following experiments. Two sorts of materials were used in this experiment, one being annealed specimens of 0.07% carbon steel and the other a plastically extended specimens of 0.13% cabon steel plate. All specimens were etched before subjecting to X-ray photography. The characteristic X-ray of CoKα_1, CrKα_1, and FeKα_1 were radiated to the specimen surface through double pin hole of 1 mm in dia. and stresses were measured by adopting the diffractions from (310), (211) and (220) atomic planes. Since it is important in stress measurement to have an accurate measure of the distance between film and specimen surface for each exposure of film, the standard substance was used and both diffraction lines of standard substance and objective materials were taken on the same film. Intensity distribution curve was taken from each pattern by using an automatic recording type microphotometer. The distance between peak position of intensity of diffraction from standard material and specimen was measured from these curves. This process led us to very easy detection of the peak of X-ray diffraction and also to exact measurement of length on the film. Stress determination was practiced by employing so-called sin^2 φ method.
社団法人日本材料学会の論文
1962-11-15

X線による応力測定法に関する研究 : 測定値の回折面依存性について : X線応力測定特集号

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