K-Capture Probabilities in the Decay of ^<169>Yb to ^<169>Tm

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概要

• 論文の詳細を見る

• Relative K-capture probabilities in the decay of "'Yb to 472 keV, long lived 379keV (52 nsec.), and 316 keV (660 nsec.) levels of "'Tm are measured using the tech-nique of gamma-K X-ray sum coincidence in a single intrinsic Ge detector. The resultsagree with the theoretical values.

• 社団法人日本物理学会の論文
• 1987-11-15

著者

• IWASHITA Takeki

  Department of Physics,Tokyo Gakugei University

• Iwashita Takeki

  Physics Department Tokyo Gakugei University

• Grewal B.S.

  Physics Department,Punjabi University

• Sahota H.S.

  Physics Department,Tokyo Gakugei University

• Sahota H.S.

  Physics Department,Tokyo Gakugei University:Physics Department,Punjabi University

• Sahota H.S.

  Physics Department,Punjabi University

関連論文

• K-Capture Probabilities and Some B (E2)Ratios in the Decay of ^Eu
• Lifetime of the 321keV Level in ^125
• Docay of Eu^
• Gamma-Gamma Angular Correlations in Sb^
• Decay of Ce^
• The Energy Levels of Te^
• Gamma-Gamma Directional Correlation in the Decay of 168Tm
• K-Capture Probabilities in the Decay of ^Yb to ^Tm
• Nature of the 153 and 270 keV Transitons in ^Sb from ^Te

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