Effects in the Proton Bombardment of NaF Crystals. : II. Depth Profile of Damage in Microhardness
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Proton-induced change in microhardness was measured on the cleavage plane of NaF crystals as a function of depth from the bombarded surface. The profile obtained includes maxima, one of which is possibly due to the protons stopped after penetration. The others appear to be related to either the nuclear reaction ^<19>F(P,αγ)^<16>O or the strain resulting from expansion due to the atomic displacements by protons. The hardening centers are likely to be submicroscopic inclusions, probably consisting of metallic precipitates and gas bubbles as well as voids. Decrease in the microhardness beyond the range end is exponential up to about 20μm, while the change in dislocation mobility extends as far as 100μm beyond the range end. The form of the profile is influenced by both temperature and proton dosage.
- 社団法人日本物理学会の論文
- 1973-07-05
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