X-Ray Diffraction Micrography on the Twin Structure of Antiferromagnetic Nickel Oxide
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X-ray diffraction micrography was performed on cleavage faces of nickel oxide to observe the twin structures which describe a kind of antiferromagnetic domains in this oxide and owe their formation to a small rhombohedral distortion of the cubic lattice on the transition from paramagnetic state to antiferromagnetic one. Berg-Barrett method and the back-reflection x-ray micrography initiated in this work were employed for this purpose and informations were obtained not only on the twin structures but also on some crystal imperfections. Use was also made of Schulz technique to measure small inclinations of the reflecting planes in different twin components. As compared with well annealed crystals, as-cloven specimens and also quenched ones were found to contain fairly stable and complicated twin structures.
- 社団法人日本物理学会の論文
- 1962-08-05
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