The Structural Studies of Amorphous Ge Films Prepared by Vacuum Deposition
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概要
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Structural studies on vacuum-deposited amorphous Ge films have been carriedout by high resolution electron microscopy using an axial beam illumination.Crossed lattice images are observed in the films, which show that the amorphousfilms consist of micro-crystallites. The micro-crystallite size is about 14 A indiameter. It is shown that the 14 A micro-crystallite has a minimum value ofthe surface energy. An oriented and a distorted micro-crystallite models basedon the diamond structure are proposed for the amorphous Ge and Si. The dis-torted micro-crystallite model interprets the diffraction intensity over the widescattering angle, much better than any model that has ever been reported.
- 社団法人日本物理学会の論文
- 1984-12-15
著者
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Saito Yoshio
Department Of Physics Kyoto Technical University
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SAITO Yoshio
Department of Chemistry, Faculty of Science and Technology, Keio Univerisity
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