X-Ray Raman Scattering. III. : The Angular Dependence of the Scattering Intensity

概要

論文の詳細を見る
The angular dependence of the intensity of X-ray Raman scattering from polycrystalline beryllium and graphite has been studied using Cr Kβ_1 and Cu Kα radiations, respectively. At lower scattering angles the angular dependence of the peak intensity values of the Raman band is in good agreement with the theoretical curve deduced from the dipole approximation. A marked discrepancy, however, appeared at higher scattering angles. This discrepancy could be mitigated by an improved analysis which takes into account the multipole transitions. The expression obtained for the intensity of the X-ray Raman scattering is: I(θ,λ)∝(1+cos^2θ)[T_1(λ)((4πa)/(λ_0)sinθ/2)^2+T_2(λ)((4πa)/(λ_0)sinθ/2)^4], where "a" denotes the mean radius of the charge distribution of the K-electron of the scatterer elements, T_1(λ) and T_2(λ) are related with the dipole and multipole transitions, respectively.
社団法人日本物理学会の論文
1975-12-15