Polarization Interferometry of X-Ray Diffraction

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概要

• 論文の詳細を見る

• A new type of X-ray diffraction interferometry is described, in which σ-and π-polarized X-rays diffracted by a sample crystal interfere with each other. A reversal of image contrast in 'polarization interference topograph' due to contrary sign of a spherical strain field in a crystal is demonstrated in terms of numerical simulations by Takagi-Taupin's dynamical theory. Further, a feasibility of 'polarization holography' of X-ray diffraction is pointed out.

• 社団法人日本物理学会の論文
• 1993-03-15

著者

• OKITSU Kouhei

  Department of Physics, Toyanta University

• Okitsu K

  Toyota Technological Inst. Nagoya Jpn

• Okitsu Kouhei

  Department of Physics, Toyama University, 3190 Gofuku, Toyama 930, Japan

関連論文

• Mierodefects in an As-Grown Czoehralski Silicon Crystal Studied by Synchrotron Radiation Section Topography with Aid of Computer Simulation
• Observation of Microdefects in As-Grown Czochralski Silicon Crystals by Synchrotron Radiation Topography
• Numerically Simulated and Experimentally Obtained X-Ray Section Topographs of a Spherical Strain Field in a Floating Zone Silicon Crystal
• Polarization Interferometry of X-Ray Diffraction

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