Intensity Measurement of Electron Diffraction Ring Patterns by Means of "Gegenfeld" Filter Technique

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概要

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• The electron diffraction intensities of evaporated gold, silver and aluminium films are measured by the use of "Gegenfeld" filter technique. The result shows that the integrated line widths of the ordinary diffraction rings are much broader than those of filtered rings and the intensities vary not only with wavelength, crystal size and the structure factor but also with the filter potential. The formula obtained experimentally is I^<hkl>_∞=I^h_0 exp(cS_<hkl>λ'H). Here, I^<hkl>_∞=I^h_0 are the relative integrated intensity ratios of hkl reflections form ordinary and filtered electron diffraction patterns, S_<kkl> is the structure factor, H the crystal size, c a coefficient, and λ' is given by λ(1+0.00059/λ^2)^<1/2>, where λ is the wavelength of the electrons.

• 社団法人日本物理学会の論文
• 1966-01-05

著者

• Kuwabara Shigeya

  School Of Electrical Engineering Kure Technical College

• Kuwabara S.

  School of Electrical Engineering, Kure Technical College

関連論文

• Variation of Electron Diffraction Intensities of BiOCl Lamellar Polycrystals with Wavelength, Crystal Size and Filtering
• Intensity Measurement of Electron Diffraction Ring Patterns by Means of "Gegenfeld" Filter Technique

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