Measurement of the Refraction Effect of the Diffracted W-Rays from a Silicon Single Crystal
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概要
- 論文の詳細を見る
- 社団法人日本物理学会の論文
- 1965-10-05
著者
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Kikuta S.
Faculty Of Engineering University Of Tokyo
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KOHRA K.
Department of Applied Physics, Faculty of Engineering University of Tokyo
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NAKANO S.
Institute of Pysics, College of General Education, University of Tokyo
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KIKUTA S.
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Kohra K.
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
関連論文
- Study on Temperature Effect on X-Ray Diffraction Curves from Single Crystals by a Triple-Crystal Spectrometer
- Measurement of the Refraction Effect of the Diffracted W-Rays from a Silicon Single Crystal