Study on Temperature Effect on X-Ray Diffraction Curves from Single Crystals by a Triple-Crystal Spectrometer

スポンサーリンク

概要

• 論文の詳細を見る

• For the study of the temperature effect on X-ray diffraction for a perfect crystal, precise measurements of the rocking curves were made at room and high temperatures by a triple-crystal spectrometer. The Bragg case diffraction was studied for the 111 and 333 reflctions from Ge with Cu Kα and the Laue case diffraction for the 220 reflection from Si with Cu Kα (μd=13.85) and Mo Kα(μd=1.03) where μ is the mean absorption coefficient and d the effective thickness of the specimen. The experimental results on the reflection width, peak value, integrated intensity and profiles were in fairly good agreement with the calculated ones in which both the real and imaginary parts of the structure factor were multiplied by the Debye factor exp (-M).

• 社団法人日本物理学会の論文
• 1966-08-05

著者

• Kikuta S.

  Faculty Of Engineering University Of Tokyo

• KOHRA K.

  Department of Applied Physics, Faculty of Engineering University of Tokyo

• ANNAKA S.

  Tokyo University of Mercantile Marine

• NAKANO S.

  Institute of Pysics, College of General Education, University of Tokyo

• Kohra K.

  Department Of Applied Physics Faculty Of Engineering University Of Tokyo

関連論文

• Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompamying the Bragg Reflections from Perfect Si and Ge Crystals
• Study on Temperature Effect on X-Ray Diffraction Curves from Single Crystals by a Triple-Crystal Spectrometer
• Measurement of the Refraction Effect of the Diffracted W-Rays from a Silicon Single Crystal

スポンサーリンク