Crystallographic Orientation of the Recrystallized Grain Grown in the Deformed Single Crystal of Ice

概要

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A single crystal of ice, shaped in a rectangle, with a grid of grooves on its top face was uniaxially compressed and then annealed to allow recrystallization. Although many recrystallized fine grains appeared at its grooved portion at the beginning of annealing, only a few grew into large grains invading the underneath portion in due time. It was found that the growth rate of a recrystallized grain depended linearly on the strain of the deformed matrix and also that a change occurred in activation energy at a about 215 K, indicating a transformation in the structure of the grain boundary. The diffusion coefficient of recrystallization growth (namely, diffusion coefficient of the grain boundary diffusion) at 272.7 K, estimated from the growth rate, was in good agreement with the value deduced from a model of the melting grain boundary. Crystallographic orientation of the grown grains seemed to show some preferred orientation to the c-axis of the matrix, although the fine grains which appeared at the initial stage were randomly oriented. An attempt was made to interpret the origin of such a peferred orientation by proposing a growth model on the basis of the kinetic point of view.
北海道大学の論文
1985-03-30