Investigation of Hot-Carrier-Induced, Abnormal gm Degradation in Sub-0.1-μm-Channel nMOSFETs/SIMOX with LDD Structure

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概要

• 論文の詳細を見る
• 関西大学の論文

著者

• Omura Yasuhisa

  Department Of Applied Science Faculty Of Engineering Kyusyu University Electronic Equipment Develop

• Omura Yasuhisa

  Department Of Electric Engineering

関連論文

• Simulations of High-Frequency Thermal Noise in Silicon-on-Insulator MOSFETs Using Distributed-Transmission-Line Model(Special lssue on Silicon RF Device & lntegrated Circuit Technologies)
• Investigation of Hot-Carrier-Induced, Abnormal gm Degradation in Sub-0.1-μm-Channel nMOSFETs/SIMOX with LDD Structure
• Theory of Surface Magnetoplasma Wave Near Cyclotron Harmonics in Strong Spatial Dispersion Region
• Theory of Surface Magnetoplasma Wave in Weak Spatial Dispersion Region

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