ラドンに由来するバックグラウンド計数の低減と安定化 : 液体シンチレーションカウンターにおける

概要

論文の詳細を見る
The 3H channel background count rate of a liquid scintillation counter in Tritium Research Center, Toyama Univ. showed a daily fluctuation due to adsorption of radon and/or its daughter elements on a vial surface. To reduce and stabilize the background count rate, the following experiment was performed. Three background samples which were emulsion scintillators in 20ml Teflon Vials, two being covered with polystyene cups, were measured for the 3H channel count rate. The count rate of the non-insulated sample increased from 2 to 5 cpm and those of the two insulated samples were each about 1.5 cpm less. This suggests that the vial coverage considerably reduce the background count rate. Background samples (D, E, F) having the same count rate were measured under different conditions (D: non-insulated, E: insulated by polystyrene cup, F: insulated by polystyrene cup and sponge rubber). The averaged count rate and standard deviation (±2s) of samples D, E, and F were 2.71±0.88, 1.98±0.49, 1.96±0.33, respectively. Thus, the insulation of a vial from Rn and its daughter elements in room air caused the background count rate to reduced and stabilized.
富山大学の論文