Test Pattern Ordering and Selection for High Quality Test Set under Constraints
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概要
- 論文の詳細を見る
- 2012-12-01
著者
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Inoue Michiko
The Graduate School Of Information Science Nara Institute Of Science And Technology(naist)
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INOUE Michiko
the Graduate School of Information Science, Nara Institute of Science and Technology
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TAKETANI Akira
the Graduate School of Information Science, Nara Institute of Science and Technology
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YONEDA Tomokazu
the Graduate School of Information Science, Nara Institute of Science and Technology
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FUJIWARA Hideo
the Faculty of Informatics, Osaka Gakuin University
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- High-Level Synthesis for Weakly Testable Data Paths(Special Issue on Test and Diagnosis of VLSI)
- Fault-Tolerance of Distributed Algorithms : Self-Stabilization and Wait-Freedom(Special Issue on Algorithm Engineering : Surveys)
- Efficient Linearizable Implementation of Shared FIFO Queues and General Objects on a Distributed System(Special Section on Discrete Mathematics and Its Applications)
- Test Pattern Ordering and Selection for High Quality Test Set under Constraints