Characterization of Vertical Alignment Film by X-Ray Reflectivity
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概要
- 論文の詳細を見る
Depth profile of mass density of vertical alignment film was investigated by X-ray reflectivity, in order to characterize side chains at film surface for vertical alignment of liquid crystals. Existence thin and low density top layer at surface of polyimide film, which was considered to be side chains, was clearly detected. Furthermore, existence of high density layer just below side chain layer was also found, and it is suggested that backbone chain ordering at film surface. Effect of rubbing on VA film was not detected. However, density growth by annealing just below side chain layer of rubbed VA film suggests more ordered backbone chain alignment induced by rubbing.
- （社）電子情報通信学会の論文
- 2011-11-01
著者
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Hirosawa Ichiro
Japan Synchrotron Radiation Research Institute
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Hirosawa Ichiro
Japan Synchrotron Radiation Res. Inst. (jasri) Hyogo Jpn
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Ishii Hidenori
Nissan Chemical Industries. Ltd.
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Koganezawa Tomoyuki
Japan Synchrotron Radiation Research Institute
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